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Scan chain
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#	Item
11	Haliplex www.xjtag.com E N T E R P R I S E Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2013-06-18 12:24:25 Electronics Boundary scan Joint Test Action Group Embedded system I²C Scan chain Electronics manufacturing Manufacturing Electronic engineering
12	Datasheet High Quality, Low Cost Test Overview DFTMAX™ is a comprehensive Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2015-03-20 14:15:36 Electronics manufacturing Electronic design Integrated circuits Automatic test pattern generation Test compression Scan chain Boundary scan Joint Test Action Group Physical design Electronic engineering Electronics Electronic design automation
13	Datasheet TetraMAX ATPG Automatic Test Pattern Generation Overview Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2015-02-18 14:15:52 Integrated circuits Automatic test pattern generation Electronics manufacturing Electronic design Test compression Scan chain Iddq testing Joint Test Action Group Synopsys Electronic engineering Electronics Electronic design automation
14	Keith & Koep GmbH www.xjtag.com Keith & Koep GmbH increases productivity and quality using XJTAG Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2013-09-05 05:42:01 Electronic engineering Joint Test Action Group Boundary scan Functional testing Scan chain Automated X-ray inspection Embedded system Manufacturing Electronics manufacturing Electronics
15	IKOR Group www.xjtag.com HOME APPLIANCES AUTOMOTIVE Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2010-04-08 06:42:01 Electronics Boundary scan In-circuit test Design for testing Joint Test Action Group Test engineer Scan chain Fault coverage Test Electronics manufacturing Electronic engineering Manufacturing
16	Datasheet DFTMAX Ultra Compression for Highest Test Quality and Lowest Test Cost Overview Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 14:32:25 Integrated circuits Electronic design Software testing Automatic test pattern generation Scan chain Code coverage Automatic test equipment Fault coverage Electronic engineering Electronics Electronic design automation
17	Imagination develops SoCs faster using XJTAG boundary scan Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2009-09-07 08:16:06 Technology Joint Test Action Group Boundary scan System on a chip Scan chain Design for testing Electronics manufacturing Electronic engineering Electronics
18	Century www.xjtag.com Brazil’s leading set-top box provider chooses XJTAG Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2009-06-23 11:50:12 Electronic engineering Joint Test Action Group In-circuit test Boundary scan Information and communication technologies in education Scan chain Electronics manufacturing Electronics Technology
19	www.xjtag.com Imagination Technologies Mark Dunn, VP Engineering with Simon Payne, CEO XJTAG Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2009-09-07 08:16:06 Technology Joint Test Action Group Boundary scan System on a chip Scan chain Design for testing Electronics manufacturing Electronic engineering Electronics
20	Haliplex www.xjtag.com E N T E R P R I S E Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2013-06-18 12:25:01 Electronics Boundary scan Joint Test Action Group Embedded system Scan chain I²C Electronics manufacturing Manufacturing Electronic engineering

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